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DANGER
z Before performing test operation (b it device on/off, word device's presen
value changing, timer/counter's set value and present value changing,
buffer memory's present value changi ng) for a user-created monitor scre
or system monitoring, read the manual carefully to fully understand how
operate the equipment.
During test operation, never change the data of the devices which are u
to perform significant operation for the system.
False output or malfuncti on can cause an accident.
模塊 A1SD32ID2
模塊 AD35ID1
模塊 A1SJ71ID2-R4
模塊 A1SD32ID1
模塊 AJ35PTC-CNV-GI
模擬量輸出模塊 A616DAI
中繼模塊 AJ65BT-RPI-10A
電流輸入模擬量模塊 Q68ADI
模塊 A1SJ71ID1-R4
適配器 Q6DIN2
ID接口模塊 QD35ID1
適配器 Q6DIN3
模塊 AJ35PTC-CNV-SI
ID接口模塊 QD35ID2
模擬輸出模塊 A616DAI
中斷模塊 AI61
外部輸入/輸出單元 GT15-DIOR
模擬量模塊 AJ65BT-64DAI
模擬量輸出模塊 A1S68DAI
模擬量輸出模塊 Q68DAV，Q68DAI
模塊 AJ71ID1-R4
適配器 Q6DIN1
模塊 AJ35PTC-CNV-GI
CCLink模塊 AJ65BT-64DAI
模塊 AJ71ID2-R4
仿真單元 A6SIM-X64Y64
模塊 A1SD35ID2
模擬量模塊 AJ65VBTCU-68ADIN
中斷輸入模塊 QI60
AS-I主站模塊 FX2N-32ASI-M